REDUNDANCY OPTIMIZATION IN GENERAL SYSTEMS.AGGARWAL KK.1976; I.E.E.E. TRANS. RELIABIL.; U.S.A.; DA. 1976; VOL. R-25; NO 5; PP. 330-332; BIBL. 13 REF.Article

RELIABILITY OF PROBABILISTIC LOGIC CIRCUITS WITH RANDOM INPUTS.AGGARWAL KK.1976; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1976; VOL. 15; NO 6; PP. 627-628; BIBL. 6 REF.Article

OUTPUT PROBABILITY EXPRESSION FOR GENERAL COMBINATIONAL NETWORKSAGGARWAL KK.1978; MICROELECTRON. AND RELIABIL.; GBR; DA. 1978; VOL. 17; NO 6; PP. 601-602; BIBL. 5 REF.Article

AN ALGORITHM FOR MINIMUM LENGTH FAULT TESTS FOR COMBINATIONAL CIRCUITSAGGARWAL KK.1978; INTERNATION. J. ELECTRON.; GBR; DA. 1978; VOL. 45; NO 6; PP. 641-648; BIBL. 12 REF.Article

DISTRIBUTION FUNCTION AND RELIABILITY OF COMPLEX DIGITAL CIRCUITS WITH RANDOM INPUTS.AGGARWAL KK.1977; INTERNATION. J. ELECTRON.; G.B.; DA. 1977; VOL. 42; NO 1; PP. 91-95; BIBL. 4 REF.Article

MINIMUM COST SYSTEMS WITH SPECIFIED RELIABILITY.AGGARWAL KK.1977; I.E.E.E. TRANS. RELIABIL.; U.S.A.; DA. 1977; VOL. 26; NO 3; PP. 166-167; BIBL. 5 REF.Article

NEW CONCEPTS IN EARLY FAILURE MODELLINGGOVIL KK; AGGARWAL KK.1982; MICROELECTRON. RELIAB.; ISSN 0026-2714; GBR; DA. 1982; VOL. 22; NO 4; PP. 709-710; BIBL. 4 REF.Article

ON ISSUES IN FAULT-TOLERANT COMPUTER DESIGNSOI IM; AGGARWAL KK.1981; COMPUT. ELECTR. ENG.; ISSN 0045-7906; USA; DA. 1981; VOL. 8; NO 3; PP. 229-234; BIBL. 18 REF.Article

AN ALGORITHM FOR FINDING BOOLEAN DIFFERENCES.SURESH RAI; AGGARWAL KK.1977; J. INSTIT. ELECTRON. TELECOMMUNIC. ENGRS; INDIA; DA. 1977; VOL. 23; NO 11; PP. 644-645; BIBL. 7 REF.Article

RELIABILITY EVALUATION OF A SYSTEM.AGGARWAL KK; GUPTA JS.1974; J. INSTIT. ELECTRON. TELECOMMUNIC. ENGRS; INDIA; DA. 1974; VOL. 20; NO 8; PP. 391-393; BIBL. 10 REF.Article

SYNTHESIS OF SUB-OPTIMAL RC FILTERS.GUPTA JS; AGGARWAL KK.1974; J. INSTIT. ELECTRON. TELECOMMUNIC. ENGRS; INDIA; DA. 1974; VOL. 20; NO 5; PP. 167-169; BIBL. 6 REF.Article

MODELLING EARLY, CHANCE AND WEAR OUT FAILURES BY A SINGLE FAILURE RATE EQUATIONGOVIL KK; AGGARWAL KK.1982; RELIAB. ENG.; ISSN 0143-8174; GBR; DA. 1982; VOL. 3; NO 5; PP. 339-343; BIBL. 7 REF.Article

RELIABILITY INDICES FOR TOPOLOGICAL DESIGN OF COMPUTER COMMUNICATION NETWORKSSOI IM; AGGARWAL KK.1981; IEEE TRANS. RELIAB.; ISSN 0018-9529; USA; DA. 1981; VOL. 30; NO 5; PP. 438-443; BIBL. 20 REF.Article

A LIFE-CYCLE COST VIEWPOINT OF SOFTWARE MAINTAINABILITYSOI IM; AGGARWAL KK.1981; COMPUT. ELECTR. ENG.; ISSN 0045-7906; USA; DA. 1981; VOL. 8; NO 4; PP. 277-282; BIBL. 18 REF.Article

AN EFFICIENT METHOD FOR RELIABILITY EVALUATION OF A GENERAL NETWORKSURESH RAI; AGGARWAL KK.1978; I.E.E.E. TRANS. REHABILIT.; USA; DA. 1978; VOL. 27; NO 3; PP. 206-211; BIBL. 11 REF.Article

TIME-SHIFTED RAYLEIGH DENSITY FOR WEAROUT FAILURESGOVIL KK; AGGARWAL KK.1982; MICROELECTRON. RELIAB.; ISSN 0026-2714; GBR; DA. 1982; VOL. 22; NO 4; PP. 707-708; BIBL. 3 REF.Article

ON RELIABLE SOFTWARE DEVELOPMENT FOR MICROPROCESSORSSOI IM; AGGARWAL KK.1980; MICROELECTRON. AND RELIABIL.; GBR; DA. 1980; VOL. 20; NO 3; PP. 273-279; BIBL. 17 REF.Article

PATH ENUMERATION USING FLOW GRAPHS = ENUMERATION DES CHEMINS UTILISANT DES GRAPHES DE FLUENCERAI S; AGGARWAL KK.1979; MICROELECTRON. AND RELIABIL.; GBR; DA. 1979; VOL. 19; NO 4; PP. 391-393; BIBL. 2 REF.Article

SYMBOLIC RELIABILITY EVALUATION USING LOGICAL SIGNAL RELATIONSAGGARWAL KK; SURESH RAI.1978; I.E.E.E. TRANS. REHABILIT.; USA; DA. 1978; VOL. 27; NO 3; PP. 202-205; BIBL. 11 REF.Article

ON BUILT-IN TEST TECHNIQUES IN RELIABLE COMPUTER SYSTEMSSOI IM; AGGARWAL KK.1981; COMPUT. ELECTR. ENG.; ISSN 0045-7906; USA; DA. 1981; VOL. 8; NO 2; PP. 109-114; BIBL. 18 REF.Article

SOFTWARE RELIABILITY OF PROGRAMS WITH NETWORK STRUCTURESURI PK; AGGARWAL KK.1981; MICROELECTRON. RELIAB.; ISSN 0026-2714; GBR; DA. 1981; VOL. 21; NO 2; PP. 203-207; BIBL. 12 REF.Article

ON HUMAN RELIABILITY TRENDS IN DIGITAL COMMUNICATION SYSTEMSSOI IM; AGGARWAL KK.1980; MICROELECTRON. RELIAB.; ISSN 0026-2714; GBR; DA. 1980; VOL. 20; NO 6; PP. 823-830; BIBL. 12 REF.Article

DERIVATION OF MINIMUM LENGTH FAULT TESTS FOR COMBINATIONAL CIRCUITSSURESH RAI; AGGARWAL KK.1979; MICROELECTRON. AND RELIABIL.; GBR; DA. 1979; VOL. 19; NO 3; PP. 275-276; BIBL. 5 REF.Article

RELIABILITY EVALUATION IN COMPLEX SYSTEMS WITH MANY FAILURE MODES.KRISHNA GOPAL; AGGARWAL KK; GUPTA JS et al.1976; INTERNATION. J. SYST. SCI.; G.B.; DA. 1976; VOL. 7; NO 12; PP. 1387-1392; BIBL. 13 REF.Article

COMPUTATIONAL TIME AND ABSOLUTE ERROR COMPARISON FOR RELIABILITY EXPRESSION DERIVED BY VARIOUS METHODS.AGGARWAL KK; GUPTA JS; MISRA KB et al.1975; MICROELECTRON. AND RELIABIL.; G.B.; DA. 1975; VOL. 14; NO 5-6; PP. 465-467; BIBL. 2 REF.Article